[2021]: Dldss-110
| Feature | DLDSS‑110 | Typical Alternative (e.g., confocal sensor) | |---------|-----------|--------------------------------------------| | | Up to 5 kHz | 0.5 – 2 kHz | | Resolution | 0.8 µm RMS | 1–2 µm | | Footprint | 200 × 150 mm | 300 × 250 mm | | Power | 12 V / 4 A (PoE optional) | 24 V / 8 A | | Eye safety | Class III‑B with automatic shutter | Often Class II or higher | | Integration | USB‑3.0 & Ethernet with SDK | Proprietary USB‑2.0 only | | Cost | Mid‑range (≈ $6,800) | High (≈ $12,000) |
| Action | Frequency | Details | |--------|-----------|---------| | | Monthly or after dusty environments | Use a lint‑free swab with isopropyl alcohol (≥ 99 %). Avoid touching the mirror surfaces. | | Check galvanometer bearings | Every 6 months | Verify smooth motion; listen for abnormal squeaking. | | Software update | As released | Download from the vendor portal; includes bug fixes and new acquisition modes. | | Eye‑safety verification | Every 12 months | Confirm that the built‑in safety interlock and shutter operate correctly. | | Backup configuration | After each major change | Store the .cfg file on an external drive or cloud storage. | dldss-110
| Industry | Application | Benefit | |----------|-------------|----------| | | Wafer topography mapping | Detect sub‑nanometer surface variations before lithography | | Automotive | Laser‑based surface roughness inspection of engine blocks | High‑throughput QC without physical contact | | Aerospace | Composite panel defect detection (delamination, voids) | Rapid 3‑D reconstruction for non‑destructive testing | | Additive manufacturing | In‑process monitoring of printed part geometry | Real‑time feedback loops to correct layer deposition | | Cultural heritage | High‑resolution 3‑D scanning of artifacts | Non‑invasive documentation with micron‑scale detail | | Robotics | Vision system for autonomous pick‑and‑place | Provides depth maps for precise grasp planning | | Feature | DLDSS‑110 | Typical Alternative (e
| Parameter | Value | Remarks | |-----------|-------|---------| | | 532 nm DPSS, 100 mW max | Eye‑safe class III‑B, built‑in power regulation | | Scanning mechanism | Dual‑axis galvanometer (θ‑axis: ±12°, φ‑axis: ±6°) | Closed‑loop control, < 2 µrad repeatability | | Detector | 1‑D linear CMOS array, 4096 pixels | 14‑bit depth, 10 µm pixel pitch | | Scan speed | Up to 5 kHz line rate | Adjustable via firmware | | Positional accuracy | ≤ 0.8 µm (RMS) | Calibration routine included | | Interface | USB‑3.2 Gen 1, Ethernet (TCP/IP) | Plug‑and‑play drivers for Windows, Linux, macOS | | Power consumption | 12 V / 4 A (max) | Optional PoE‑over‑Ethernet mode | | Operating temperature | 0 °C – 45 °C | Built‑in thermal management | | Dimensions | 200 × 150 × 80 mm | Mountable on standard optical tables | | Weight | 1.2 kg | Hand‑carryable for field use | | | Software update | As released |
As with most modern microcontrollers, the DLDSS-110 requires a comprehensive software development environment to unleash its full potential. Some of the development tools and software frameworks commonly used with the DLDSS-110 include:
| Feature | DLDSS‑110 | Typical Alternative (e.g., confocal sensor) | |---------|-----------|--------------------------------------------| | | Up to 5 kHz | 0.5 – 2 kHz | | Resolution | 0.8 µm RMS | 1–2 µm | | Footprint | 200 × 150 mm | 300 × 250 mm | | Power | 12 V / 4 A (PoE optional) | 24 V / 8 A | | Eye safety | Class III‑B with automatic shutter | Often Class II or higher | | Integration | USB‑3.0 & Ethernet with SDK | Proprietary USB‑2.0 only | | Cost | Mid‑range (≈ $6,800) | High (≈ $12,000) |
| Action | Frequency | Details | |--------|-----------|---------| | | Monthly or after dusty environments | Use a lint‑free swab with isopropyl alcohol (≥ 99 %). Avoid touching the mirror surfaces. | | Check galvanometer bearings | Every 6 months | Verify smooth motion; listen for abnormal squeaking. | | Software update | As released | Download from the vendor portal; includes bug fixes and new acquisition modes. | | Eye‑safety verification | Every 12 months | Confirm that the built‑in safety interlock and shutter operate correctly. | | Backup configuration | After each major change | Store the .cfg file on an external drive or cloud storage. |
| Industry | Application | Benefit | |----------|-------------|----------| | | Wafer topography mapping | Detect sub‑nanometer surface variations before lithography | | Automotive | Laser‑based surface roughness inspection of engine blocks | High‑throughput QC without physical contact | | Aerospace | Composite panel defect detection (delamination, voids) | Rapid 3‑D reconstruction for non‑destructive testing | | Additive manufacturing | In‑process monitoring of printed part geometry | Real‑time feedback loops to correct layer deposition | | Cultural heritage | High‑resolution 3‑D scanning of artifacts | Non‑invasive documentation with micron‑scale detail | | Robotics | Vision system for autonomous pick‑and‑place | Provides depth maps for precise grasp planning |
| Parameter | Value | Remarks | |-----------|-------|---------| | | 532 nm DPSS, 100 mW max | Eye‑safe class III‑B, built‑in power regulation | | Scanning mechanism | Dual‑axis galvanometer (θ‑axis: ±12°, φ‑axis: ±6°) | Closed‑loop control, < 2 µrad repeatability | | Detector | 1‑D linear CMOS array, 4096 pixels | 14‑bit depth, 10 µm pixel pitch | | Scan speed | Up to 5 kHz line rate | Adjustable via firmware | | Positional accuracy | ≤ 0.8 µm (RMS) | Calibration routine included | | Interface | USB‑3.2 Gen 1, Ethernet (TCP/IP) | Plug‑and‑play drivers for Windows, Linux, macOS | | Power consumption | 12 V / 4 A (max) | Optional PoE‑over‑Ethernet mode | | Operating temperature | 0 °C – 45 °C | Built‑in thermal management | | Dimensions | 200 × 150 × 80 mm | Mountable on standard optical tables | | Weight | 1.2 kg | Hand‑carryable for field use |
As with most modern microcontrollers, the DLDSS-110 requires a comprehensive software development environment to unleash its full potential. Some of the development tools and software frameworks commonly used with the DLDSS-110 include:
